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GIS and point-pattern analysis

June 26, 2017 @ 1:00 pm - 4:00 pm

Rackham Building, Earl Lewis Room, 3rd Floor East

This is the first workshop in a series of three workshops that will cover spatial modeling of three broad classes of data: (i) spatial point pattern, (ii) discrete spatial variation on areal units, and (iii) continuous spatial variation.

Spatial point (and marked point) process models help us analyze the geometrical pattern of points in space and find application in a variety of fields including forestry, ecology, business, and public health. This workshop will provide an introduction to the point process model focusing on the conceptual aspects and implementation in a GIS environment.

Details

Date:
June 26, 2017
Time:
1:00 pm - 4:00 pm
Event Category:

Venue

Rackham Building, Earl Lewis Room, 3rd Floor East
915 E. Washington St.
Ann Arbor, MI 48109 United States

Other

Class size
36
U-M Affiliated Fee
0
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