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GIS and point-pattern analysis
June 26, 2017 @ 1:00 pm - 4:00 pm
Rackham Building, Earl Lewis Room, 3rd Floor East
This is the first workshop in a series of three workshops that will cover spatial modeling of three broad classes of data: (i) spatial point pattern, (ii) discrete spatial variation on areal units, and (iii) continuous spatial variation.
Spatial point (and marked point) process models help us analyze the geometrical pattern of points in space and find application in a variety of fields including forestry, ecology, business, and public health. This workshop will provide an introduction to the point process model focusing on the conceptual aspects and implementation in a GIS environment.